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1

Theory of the scanning tunneling microscope

Tersoff, J., Hamann, D. R.

Journal:

Physical Review B

Année:

1985

Langue:

english

Fichier:

PDF, 550 KB

english, 1985

2

New empirical approach for the structure and energy of covalent systems

Journal:

Physical Review B

Année:

1988

Langue:

english

Fichier:

PDF, 984 KB

english, 1988

3

Modeling solid-state chemistry: Interatomic potentials for multicomponent systems

Journal:

Physical Review B

Année:

1989

Langue:

english

Fichier:

PDF, 143 KB

english, 1989

4

Theory of semiconductor heterojunctions: The role of quantum dipoles

Journal:

Physical Review B

Année:

1984

Langue:

english

Fichier:

PDF, 190 KB

english, 1984

5

Empirical interatomic potential for silicon with improved elastic properties

Journal:

Physical Review B

Année:

1988

Langue:

english

Fichier:

PDF, 163 KB

english, 1988

6

Empirical Interatomic Potential for Carbon, with Applications to Amorphous Carbon

Journal:

Physical Review Letters

Année:

1988

Langue:

english

Fichier:

PDF, 203 KB

english, 1988

7

The formation of disilicides from bilayers of Ni/Co and Co/Ni on silicon: Phase separation and solid solution

T.G. Finstad, D.D. Anfiteatro, V.R. Deline, F.M. d'Heurle, P. Gas, V.L. Moruzzi, K. Schwarz, J. Tersoff

Journal:

Thin Solid Films

Année:

1986

Langue:

english

Fichier:

PDF, 786 KB

english, 1986

8

Some properties of ReSi2

C. Krontiras, L. Grönberg, I. Suni, F.M. d'Heurle, J. Tersoff, I. Engström, B. Karlsson, C.S. Petersson

Journal:

Thin Solid Films

Année:

1988

Langue:

english

Fichier:

PDF, 533 KB

english, 1988

9

10.1038/17767

Tersoff, J., Venezuela, P., Floro, J. A., Chason, E., Follstaedt, D. M., Liu, Feng, Lagally, M. G.

Journal:

Année:

1999

Langue:

english

Fichier:

PDF, 765 KB

english, 1999

10

New empirical model for the structural properties of silicon

Journal:

Physical Review Letters

Année:

1986

Langue:

english

Fichier:

PDF, 455 KB

english, 1986

11

Interface magnetization: Cu films on Ni(100)

Tersoff, J., Falicov, L. M.

Journal:

Physical Review B

Année:

1982

Langue:

english

Fichier:

PDF, 233 KB

english, 1982

12

Ga droplet surface dynamics during Langmuir evaporation of GaAs

Tang, W.-X., Zheng, C.-X., Zhou, Z.-Y., Jesson, D. E., Tersoff, J.

Journal:

IBM Journal of Research and Development

Année:

2011

Langue:

english

Fichier:

PDF, 6.43 MB

english, 2011

13

Germanium Nanowire Growth Below the Eutectic Temperature

Kodambaka, S., Tersoff, J., Reuter, M. C., Ross, F. M.

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 280 KB

english, 2007

14

Chemical order in amorphous silicon carbide

Journal:

Physical Review B

Année:

1994

Langue:

english

Fichier:

PDF, 217 KB

english, 1994

15

Schottky barriers and semiconductor band structures

Journal:

Physical Review B

Année:

1985

Langue:

english

Fichier:

PDF, 206 KB

english, 1985

16

Coarsening of Self-Assembled Ge Quantum Dots on Si(001)

Ross, F. M., Tersoff, J., Tromp, R. M.

Journal:

Physical Review Letters

Année:

1998

Langue:

english

Fichier:

PDF, 911 KB

english, 1998

17

Tunneling microscopy study of the graphite surface in air and water

Schneir, J., Sonnenfeld, R., Hansma, P. K., Tersoff, J.

Journal:

Physical Review B

Année:

1986

Langue:

english

Fichier:

PDF, 1.46 MB

english, 1986

18

Competing relaxation mechanisms in strained layers

Tersoff, J., LeGoues, F. K.

Journal:

Physical Review Letters

Année:

1994

Langue:

english

Fichier:

PDF, 493 KB

english, 1994

19

Dislocations and strain relief in compositionally graded layers

Journal:

Applied Physics Letters

Année:

1993

Langue:

english

Fichier:

PDF, 524 KB

english, 1993

20

Energies of fullerenes

Journal:

Physical Review B

Année:

1992

Langue:

english

Fichier:

PDF, 168 KB

english, 1992

21

Interface

Tu, Yuhai, Tersoff, J.

Journal:

Physical Review Letters

Année:

2000

Langue:

english

Fichier:

PDF, 152 KB

english, 2000

22

Measurement of the activation barrier to nucleation of dislocations in thin films

LeGoues, F. K., Mooney, P. M., Tersoff, J.

Journal:

Physical Review Letters

Année:

1993

Langue:

english

Fichier:

PDF, 768 KB

english, 1993

23

charge transfer at transition- and noble-metal surfaces: A reply

Tersoff, J., Falicov, L. M.

Journal:

Physical Review B

Année:

1982

Langue:

english

Fichier:

PDF, 47 KB

english, 1982

24

Equilibrium crystal shape of silicon near (001)

Tersoff, J., Pehlke, E.

Journal:

Physical Review B

Année:

1993

Langue:

english

Fichier:

PDF, 186 KB

english, 1993

25

Calculation of magnetization in ordered Ni-Cu alloys

Tersoff, J., Falicov, L. M.

Journal:

Physical Review B

Année:

1982

Langue:

english

Fichier:

PDF, 503 KB

english, 1982

26

Magnetic and electronic properties of Ni films, surfaces, and interfaces

Tersoff, J., Falicov, L. M.

Journal:

Physical Review B

Année:

1982

Langue:

english

Fichier:

PDF, 839 KB

english, 1982

27

Heterojunction band lineups in Si-Ge alloys using spatially resolved electron-energy-loss spectroscopy

Morar, J. F., Batson, P. E., Tersoff, J.

Journal:

Physical Review B

Année:

1993

Langue:

english

Fichier:

PDF, 190 KB

english, 1993

28

Missing dimers and strain relief in Ge films on Si(100)

Journal:

Physical Review B

Année:

1992

Langue:

english

Fichier:

PDF, 165 KB

english, 1992

29

Calculation of temperature effects on the equilibrium crystal shape of Si near (100)

Mukherjee, S., Pehlke, E., Tersoff, J.

Journal:

Physical Review B

Année:

1994

Langue:

english

Fichier:

PDF, 482 KB

english, 1994

30

and Ni

Tersoff, J., Hamann, D. R.

Journal:

Physical Review B

Année:

1983

Langue:

english

Fichier:

PDF, 171 KB

english, 1983

31

Sensitivity of helium diffraction to surface geometry

Tersoff, J., Cardillo, M. J., Hamann, D. R.

Journal:

Physical Review B

Année:

1985

Langue:

english

Fichier:

PDF, 370 KB

english, 1985

32

From Droplets to Nanowires: Dynamics of Vapor-Liquid-Solid Growth

Schwarz, K. W., Tersoff, J.

Journal:

Physical Review Letters

Année:

2009

Langue:

english

Fichier:

PDF, 379 KB

english, 2009

33

Electronic structure and local atomic configurations of flat and stepped (111) surfaces of Ni and Cu

Tersoff, J., Falicov, L. M.

Journal:

Physical Review B

Année:

1981

Langue:

english

Fichier:

PDF, 659 KB

english, 1981

34

Nonlifetime effects in photoemission linewidths

Tersoff, J., Kevan, S. D.

Journal:

Physical Review B

Année:

1983

Langue:

english

Fichier:

PDF, 242 KB

english, 1983

35

Sample-dependent resolution in scanning tunneling microscopy

Journal:

Physical Review B

Année:

1989

Langue:

english

Fichier:

PDF, 260 KB

english, 1989

36

Scaling of Excitons in Carbon Nanotubes

Perebeinos, Vasili, Tersoff, J., Avouris, Phaedon

Journal:

Physical Review Letters

Année:

2004

Langue:

english

Fichier:

PDF, 487 KB

english, 2004

37

End-bonded contacts for carbon nanotube transistors with low, size-independent resistance

Cao, Q., Han, S.-J., Tersoff, J., Franklin, A. D., Zhu, Y., Zhang, Z., Tulevski, G. S., Tang, J., Haensch, W.

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 1.09 MB

english, 2015

38

Approaching the ideal elastic strain limit in silicon nanowires

Zhang, H., Tersoff, J., Xu, S., Chen, H., Zhang, Q., Zhang, K., Yang, Y., Lee, C.-S., Tu, K.-N., Li, J., Lu, Y.

Journal:

Science Advances

Année:

2016

Langue:

english

Fichier:

PDF, 7.44 MB

english, 2016

39

Strain distributions and their influence on electronic structures of WSe2–MoS2 laterally strained heterojunctions

Zhang, Chendong, Li, Ming-Yang, Tersoff, Jerry, Han, Yimo, Su, Yushan, Li, Lain-Jong, Muller, David A., Shih, Chih-Kang

Journal:

Nature Nanotechnology

Année:

2018

Langue:

english

Fichier:

PDF, 3.11 MB

english, 2018

40

In situ transmission electron microscopy observations of the formation of self-assembled Ge islands on Si

Ross, F.M., Tersoff, J., Reuter, M., Legoues, F.K., Tromp, R.M.

Journal:

Microscopy Research and Technique

Année:

1998

Langue:

english

Fichier:

PDF, 417 KB

english, 1998

41

Atomic scale studies of epitaxial growth processes using X-ray techniques

D.W. Kisker, G.B. Stephenson, J. Tersoff, P.H. Fuoss, S. Brennan

Journal:

Journal of Crystal Growth

Année:

1996

Langue:

english

Fichier:

PDF, 403 KB

english, 1996

42

Core-level satellite structure in photoemission spectra of transition metals

J. Tersoff, L.M. Falicov, David R. Penn

Journal:

Solid State Communications

Année:

1979

Langue:

english

Fichier:

PDF, 302 KB

english, 1979

43

Chemically induced grain boundary migration in doped polycrystalline silicon films

K.N. Tu, J. Tersoff, T.C. Chou, C.Y. Wong

Journal:

Solid State Communications

Année:

1988

Langue:

english

Fichier:

PDF, 466 KB

english, 1988

44

Calculation of Schottky barrier heights from semiconductor band structures

Journal:

Surface Science Letters

Année:

1986

Langue:

english

Fichier:

PDF, 38 KB

english, 1986

45

Stress-induced roughening in epitaxial growth

Journal:

Applied Surface Science

Année:

1996

Langue:

english

Fichier:

PDF, 162 KB

english, 1996

46

Reading the footprints of strained islands

A. Rastelli, M. Stoffel, G. Katsaros, J. Tersoff, U. Denker, T. Merdzhanova, G.S. Kar, G. Costantini, K. Kern, H. von Känel, O.G. Schmidt

Journal:

Microelectronics Journal

Année:

2006

Langue:

english

Fichier:

PDF, 510 KB

english, 2006

47

Investigating the lateral motion of SiGe islands by selective chemical etching

G. Katsaros, A. Rastelli, M. Stoffel, G. Isella, H. von Känel, A.M. Bittner, J. Tersoff, U. Denker, O.G. Schmidt, G. Costantini, K. Kern

Journal:

Surface Science

Année:

2006

Langue:

english

Fichier:

PDF, 314 KB

english, 2006

48

The stability of triangular ‘droplet’ phases on Si(1 1 1)

J.B. Hannon, J. Tersoff, R.M. Tromp

Journal:

Journal of Crystal Growth

Année:

2002

Langue:

english

Fichier:

PDF, 196 KB

english, 2002

49

Structure of the silicon–oxide interface

Yuhai Tu, J Tersoff

Journal:

Thin Solid Films

Année:

2001

Langue:

english

Fichier:

PDF, 794 KB

english, 2001

50

Kinetic effects in heteroepitaxial growth

Journal:

Applied Surface Science

Année:

2002

Langue:

english

Fichier:

PDF, 63 KB

english, 2002